| Database of nanotechnology Patent Index, 2000-2005. Tested with materials scientists and technical librarians, this product is essentially one common database which combines the entire patent publication history for this period. |
Software for analyzing and processing of images of surfaces obtained by SPM/AFMs. To date, support for Veeco/DI (NanoScope III, NanoScope IV), NT-MDT (.mdt) and MPRI (NANOTOP-205) files has been implemented. |
|
|
